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                                       Details for article 6223 of 6539 found articles
 
 
  Time-of-flight neutron diffraction investigation of temperature factors in the Zn blende semiconductor InP
 
 
Title: Time-of-flight neutron diffraction investigation of temperature factors in the Zn blende semiconductor InP
Author: Ferrari, C.
Bocchi, C.
Moze, O.
Wilson, C.C.
Fornari, R.
Appeared in: Physica. B, Condensed matter
Paging: Volume 180-181 (1992) nr. P2 pages 2 p.
Year: 1992
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6223 of 6539 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands